Dissipation-Reliability Tradeoff for Stochastic CMOS Bits in Series

Fuente: arXiv

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Bibliographic Details
Main Authors:	Murphy, Cathryn, Nicholson, Schuyler, Freitas, Nahuel, Penocchio, Emanuele, Gingrich, Todd
Format:	Preprint
Published:	2026
Subjects:	Statistical Mechanics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2603.04658