Layer by layer, module by module: Choose both for optimal OOD probing of ViT

Fuente: arXiv

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Bibliographic Details
Main Authors:	Odonnat, Ambroise, Feofanov, Vasilii, Chapel, Laetitia, Tavenard, Romain, Redko, Ievgen
Format:	Preprint
Published:	2026
Subjects:	Computer Vision and Pattern Recognition Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2603.05280