Dev, S., Sloan, A., Kavner, J., Kong, N., & Sandler, M. (2026). Judge Reliability Harness: Stress Testing the Reliability of LLM Judges.
Chicago Style (17th ed.) CitationDev, Sunishchal, Andrew Sloan, Joshua Kavner, Nicholas Kong, and Morgan Sandler. Judge Reliability Harness: Stress Testing the Reliability of LLM Judges. 2026.
MLA (9th ed.) CitationDev, Sunishchal, et al. Judge Reliability Harness: Stress Testing the Reliability of LLM Judges. 2026.
Warning: These citations may not always be 100% accurate.