An Integrated Failure and Threat Mode and Effect Analysis (FTMEA) Framework with Quantified Cross-Domain Correlation Factors for Automotive Semiconductors

Fuente: arXiv

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Bibliographic Details
Main Authors:	Armato, Antonino, Khatun, Marzana, Fischer, Sebastian
Format:	Preprint
Published:	2026
Subjects:	Cryptography and Security Hardware Architecture
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2603.06299