Physics-informed AI Accelerated Retention Analysis of Ferroelectric Vertical NAND: From Day-Scale TCAD to Second-Scale Surrogate Model

Fuente: arXiv
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Autori principali: Jeong, Gyujun, Cho, Sungwon, Shon, Minji, Kim, Namhoon, Hwang, Woohyun, Seo, Kwangyou, Lim, Suhwan, Kim, Wanki, Ha, Daewon, Venkatesan, Prasanna, Youn, Kihang, Cherukuri, Ram, Wang, Yiyi, Datta, Suman, Khan, Asif, Yu, Shimeng
Natura: Preprint
Pubblicazione: 2026
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author Jeong, Gyujun
Cho, Sungwon
Shon, Minji
Kim, Namhoon
Hwang, Woohyun
Seo, Kwangyou
Lim, Suhwan
Kim, Wanki
Ha, Daewon
Venkatesan, Prasanna
Youn, Kihang
Cherukuri, Ram
Wang, Yiyi
Datta, Suman
Khan, Asif
Yu, Shimeng
author_facet Jeong, Gyujun
Cho, Sungwon
Shon, Minji
Kim, Namhoon
Hwang, Woohyun
Seo, Kwangyou
Lim, Suhwan
Kim, Wanki
Ha, Daewon
Venkatesan, Prasanna
Youn, Kihang
Cherukuri, Ram
Wang, Yiyi
Datta, Suman
Khan, Asif
Yu, Shimeng
contents Ferroelectric field-effect transistors (FeFET)-based vertical NAND (Fe-VNAND) has emerged as a promising candidate to overcome z-scaling limitations with lower programming voltages. However, the data retention of 3D Fe-VNAND is hindered by the complex interaction between charge detrapping and ferroelectric depolarization. Developing optimized device designs requires exploring an extensive parameter space, but the high computational cost of conventional Technology Computer-Aided Design (TCAD) tools makes such wide-scale optimization impractical. To overcome these simulation barriers, we present a Physics-Informed Neural Operator (PINO)-based AI surrogate model designed for high-efficiency prediction of threshold voltage (Vth) shifts and retention behavior. By embedding fundamental physical principles into the learning architecture, our PINO framework achieves a speedup exceeding 10000x compared to TCAD while maintaining physical accuracy. The resulting surrogate provides a physics-consistent data engine for compact model parameter extraction and look-up-table (LUT) generation, directly supporting reliability-aware SPICE simulation of Fe-VNAND. This study demonstrates the model's effectiveness on a single FeFET configuration, serving as a pathway toward modeling the retention loss mechanisms.
format Preprint
id arxiv_https___arxiv_org_abs_2603_06881
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Physics-informed AI Accelerated Retention Analysis of Ferroelectric Vertical NAND: From Day-Scale TCAD to Second-Scale Surrogate Model
Jeong, Gyujun
Cho, Sungwon
Shon, Minji
Kim, Namhoon
Hwang, Woohyun
Seo, Kwangyou
Lim, Suhwan
Kim, Wanki
Ha, Daewon
Venkatesan, Prasanna
Youn, Kihang
Cherukuri, Ram
Wang, Yiyi
Datta, Suman
Khan, Asif
Yu, Shimeng
Machine Learning
Artificial Intelligence
Computational Physics
Ferroelectric field-effect transistors (FeFET)-based vertical NAND (Fe-VNAND) has emerged as a promising candidate to overcome z-scaling limitations with lower programming voltages. However, the data retention of 3D Fe-VNAND is hindered by the complex interaction between charge detrapping and ferroelectric depolarization. Developing optimized device designs requires exploring an extensive parameter space, but the high computational cost of conventional Technology Computer-Aided Design (TCAD) tools makes such wide-scale optimization impractical. To overcome these simulation barriers, we present a Physics-Informed Neural Operator (PINO)-based AI surrogate model designed for high-efficiency prediction of threshold voltage (Vth) shifts and retention behavior. By embedding fundamental physical principles into the learning architecture, our PINO framework achieves a speedup exceeding 10000x compared to TCAD while maintaining physical accuracy. The resulting surrogate provides a physics-consistent data engine for compact model parameter extraction and look-up-table (LUT) generation, directly supporting reliability-aware SPICE simulation of Fe-VNAND. This study demonstrates the model's effectiveness on a single FeFET configuration, serving as a pathway toward modeling the retention loss mechanisms.
title Physics-informed AI Accelerated Retention Analysis of Ferroelectric Vertical NAND: From Day-Scale TCAD to Second-Scale Surrogate Model
topic Machine Learning
Artificial Intelligence
Computational Physics
url https://arxiv.org/abs/2603.06881