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Physics-informed AI Accelerated Retention Analysis of Ferroelectric Vertical NAND: From Day-Scale TCAD to Second-Scale Surrogate Model

Fuente: arXiv

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Bibliographic Details
Main Authors:	Jeong, Gyujun, Cho, Sungwon, Shon, Minji, Kim, Namhoon, Hwang, Woohyun, Seo, Kwangyou, Lim, Suhwan, Kim, Wanki, Ha, Daewon, Venkatesan, Prasanna, Youn, Kihang, Cherukuri, Ram, Wang, Yiyi, Datta, Suman, Khan, Asif, Yu, Shimeng
Format:	Preprint
Published:	2026
Subjects:	Machine Learning Artificial Intelligence Computational Physics
Online Access:	Acceder al recurso
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