Interlayer Error Calibration for Stacked Intelligent Metasurfaces:Modeling, Algorithms, and Future Perspectives

Fuente: arXiv

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Bibliographic Details
Main Authors:	Jia, Xing, Liu, Hao, Niu, Haoxian, Li, Jinbao, Ding, Xiangyu, Gan, Lu
Format:	Preprint
Published:	2026
Subjects:	Signal Processing
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2603.08040