High-resolution resonant inelastic X-ray scattering study of W-L3 edge in WSi2
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arXiv
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| Format: | Preprint |
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2026
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| _version_ | 1866911503083372544 |
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| author | Zhao, Zheqian Wang, Shuxing Wang, Xiyuan Su, Yang Ma, Ziru Huang, Xinchao Zhu, Linfan |
| author_facet | Zhao, Zheqian Wang, Shuxing Wang, Xiyuan Su, Yang Ma, Ziru Huang, Xinchao Zhu, Linfan |
| contents | With the advancement of synchrotron radiation and free-electron laser, X-ray quantum optics has emerged as a novel frontier for exploring light-matter interactions at high photon energies. A significant challenge in this field is achieving well-defined two-level systems through atomic inner-shell transitions, which are often hindered by broad natural linewidths and local electronic structure effects. This study aims to explore the potential of tungsten disilicide (WSi2) as a two-level system for X-ray quantum optics applications. Utilizing high-resolution resonant inelastic X-ray scattering (RIXS) near the W-L3 edge, in this work, the white line of bulk WSi2 is experimentally distinguished, overcoming the spectral broadening caused by short core-hole lifetime. The measurements are conducted by using a von Hamos spectrometer at the GALAXIES beamline of the SOLEIL synchrotron. The results reveal a single resonant emission feature with a fixed energy transfer, confirming the presence of a discrete 2p-5d transition characteristic of a two-level system. Additional high-resolution XAS spectra, obtained via high energy resolution fluorescence detection method and reconstructed from off-resonant emission (free from self-absorption effect for bulk WSi2 sample) method, further support the identification of a sharp white line. These findings demonstrate the feasibility of using WSi2 as a model system in X-ray cavity quantum optics and establish RIXS as a powerful technique to resolve fine inner-shell structures. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2603_09561 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | High-resolution resonant inelastic X-ray scattering study of W-L3 edge in WSi2 Zhao, Zheqian Wang, Shuxing Wang, Xiyuan Su, Yang Ma, Ziru Huang, Xinchao Zhu, Linfan Quantum Physics With the advancement of synchrotron radiation and free-electron laser, X-ray quantum optics has emerged as a novel frontier for exploring light-matter interactions at high photon energies. A significant challenge in this field is achieving well-defined two-level systems through atomic inner-shell transitions, which are often hindered by broad natural linewidths and local electronic structure effects. This study aims to explore the potential of tungsten disilicide (WSi2) as a two-level system for X-ray quantum optics applications. Utilizing high-resolution resonant inelastic X-ray scattering (RIXS) near the W-L3 edge, in this work, the white line of bulk WSi2 is experimentally distinguished, overcoming the spectral broadening caused by short core-hole lifetime. The measurements are conducted by using a von Hamos spectrometer at the GALAXIES beamline of the SOLEIL synchrotron. The results reveal a single resonant emission feature with a fixed energy transfer, confirming the presence of a discrete 2p-5d transition characteristic of a two-level system. Additional high-resolution XAS spectra, obtained via high energy resolution fluorescence detection method and reconstructed from off-resonant emission (free from self-absorption effect for bulk WSi2 sample) method, further support the identification of a sharp white line. These findings demonstrate the feasibility of using WSi2 as a model system in X-ray cavity quantum optics and establish RIXS as a powerful technique to resolve fine inner-shell structures. |
| title | High-resolution resonant inelastic X-ray scattering study of W-L3 edge in WSi2 |
| topic | Quantum Physics |
| url | https://arxiv.org/abs/2603.09561 |