Frontiers of atom probe tomography physics, data processing, and analysis

Fuente: arXiv
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Main Authors: Marquis, Emmanuelle A., Devaraj, Arun, Forbes, Richard G., Ghamarian, Iman, Kühbach, Markus, Maillet, Jean-Baptiste, Mazumder, Baishakhi, Meisenkothen, Frederick, Qi, Jiayuwen, Schreiber, Daniel, Styman, Paul, Vupillot, Francois, Windl, Wolfgang
Format: Preprint
Published: 2026
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author Marquis, Emmanuelle A.
Devaraj, Arun
Forbes, Richard G.
Ghamarian, Iman
Kühbach, Markus
Maillet, Jean-Baptiste
Mazumder, Baishakhi
Meisenkothen, Frederick
Qi, Jiayuwen
Schreiber, Daniel
Styman, Paul
Vupillot, Francois
Windl, Wolfgang
author_facet Marquis, Emmanuelle A.
Devaraj, Arun
Forbes, Richard G.
Ghamarian, Iman
Kühbach, Markus
Maillet, Jean-Baptiste
Mazumder, Baishakhi
Meisenkothen, Frederick
Qi, Jiayuwen
Schreiber, Daniel
Styman, Paul
Vupillot, Francois
Windl, Wolfgang
contents Atom probe tomography (APT) fills a crucial need in the characterization workflow of materials by its ability to inform the 3D chemical microstructure at the nanoscale. As with any characterization techniques, APT has strengths and limitations that inform the interpretation of the data. Therefore, a challenge for the materials characterization community, and the APT community in particular, is the need to establish repeatable and reproducible workflows around the APT data acquisition, reconstruction, analysis, and sharing, in order to inform interpretation. Data interpretation also requires the continued development of our understanding of the physical processes responsible for field evaporation. We review recent developments in the experimental analysis of field evaporation and in the modeling of field evaporation leading to new understanding of common artifacts observed in reconstructed data. We then discuss current challenges with data analysis, translation of results, and data interpretation in the absence of community-agreed standards, and therefore, the crucial need for standardization at every stage of APT research, from data collection all the way to data reporting. This perspective is a summary of the invited presentations and discussions that took place during a workshop (August 4-5, 2024, Alexandria, Virginia, USA).
format Preprint
id arxiv_https___arxiv_org_abs_2603_10276
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Frontiers of atom probe tomography physics, data processing, and analysis
Marquis, Emmanuelle A.
Devaraj, Arun
Forbes, Richard G.
Ghamarian, Iman
Kühbach, Markus
Maillet, Jean-Baptiste
Mazumder, Baishakhi
Meisenkothen, Frederick
Qi, Jiayuwen
Schreiber, Daniel
Styman, Paul
Vupillot, Francois
Windl, Wolfgang
Materials Science
Atom probe tomography (APT) fills a crucial need in the characterization workflow of materials by its ability to inform the 3D chemical microstructure at the nanoscale. As with any characterization techniques, APT has strengths and limitations that inform the interpretation of the data. Therefore, a challenge for the materials characterization community, and the APT community in particular, is the need to establish repeatable and reproducible workflows around the APT data acquisition, reconstruction, analysis, and sharing, in order to inform interpretation. Data interpretation also requires the continued development of our understanding of the physical processes responsible for field evaporation. We review recent developments in the experimental analysis of field evaporation and in the modeling of field evaporation leading to new understanding of common artifacts observed in reconstructed data. We then discuss current challenges with data analysis, translation of results, and data interpretation in the absence of community-agreed standards, and therefore, the crucial need for standardization at every stage of APT research, from data collection all the way to data reporting. This perspective is a summary of the invited presentations and discussions that took place during a workshop (August 4-5, 2024, Alexandria, Virginia, USA).
title Frontiers of atom probe tomography physics, data processing, and analysis
topic Materials Science
url https://arxiv.org/abs/2603.10276