Microstructural Characterization of Nb3Sn Thin Films Using FIB Tomography

Fuente: arXiv

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Bibliographic Details
Main Authors:	Viklund, Eric, Seidman, David N., Posen, Sam
Format:	Preprint
Published:	2026
Subjects:	Materials Science Accelerator Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2603.10472