Dielectric Tensor of CrSBr from Spectroscopic Imaging Ellipsometry
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arXiv
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| Autori principali: | , , , , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2026
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| author | Piel, Pierre-Maurice Schaper, Sebastian Łopion, Aleksandra Henz, Jakob Soll, Aljoscha Sofer, Zdenek Wurstbauer, Ursula |
| author_facet | Piel, Pierre-Maurice Schaper, Sebastian Łopion, Aleksandra Henz, Jakob Soll, Aljoscha Sofer, Zdenek Wurstbauer, Ursula |
| contents | Chromium sulfur bromide (CrSBr) is a magnetic van der Waals semiconductor with a direct bandgap and pronounced anisotropy in its electronic, optical, spin and lattice degrees of freedom. Here, we employ spectroscopic imaging ellipsometry (SIE) and Mueller-matrix analysis to determine the full dielectric tensor of paramagnetic CrSBr thin films. Our measurements reveal optical anisotropy, characterized by three distinct diagonal components of the dielectric tensor. The in-plane elements are dominated by prominent excitonic resonances polarized along the two main crystallographic axes. Two main excitonic bands (A and B excitons) centered around 1.3eV and 1.7eV, respectively, are identified; the A-exciton polarized along the b-crystallographic direction, whereas the B-exciton appears to consist of two nearly degenerate contributions polarized along two orthogonal in-plane crystal axes. These results provide fundamental insight into anisotropic light-matter interactions in CrSBr, relevant for future spin-optoelectronic and photonic applications. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2603_10698 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Dielectric Tensor of CrSBr from Spectroscopic Imaging Ellipsometry Piel, Pierre-Maurice Schaper, Sebastian Łopion, Aleksandra Henz, Jakob Soll, Aljoscha Sofer, Zdenek Wurstbauer, Ursula Materials Science Chromium sulfur bromide (CrSBr) is a magnetic van der Waals semiconductor with a direct bandgap and pronounced anisotropy in its electronic, optical, spin and lattice degrees of freedom. Here, we employ spectroscopic imaging ellipsometry (SIE) and Mueller-matrix analysis to determine the full dielectric tensor of paramagnetic CrSBr thin films. Our measurements reveal optical anisotropy, characterized by three distinct diagonal components of the dielectric tensor. The in-plane elements are dominated by prominent excitonic resonances polarized along the two main crystallographic axes. Two main excitonic bands (A and B excitons) centered around 1.3eV and 1.7eV, respectively, are identified; the A-exciton polarized along the b-crystallographic direction, whereas the B-exciton appears to consist of two nearly degenerate contributions polarized along two orthogonal in-plane crystal axes. These results provide fundamental insight into anisotropic light-matter interactions in CrSBr, relevant for future spin-optoelectronic and photonic applications. |
| title | Dielectric Tensor of CrSBr from Spectroscopic Imaging Ellipsometry |
| topic | Materials Science |
| url | https://arxiv.org/abs/2603.10698 |