Machine Learning-Based Analysis of Critical Process Parameters Influencing Product Quality Defects: A Real-World Case Study in Manufacturing

Fuente: arXiv

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Bibliographic Details
Main Authors:	Rajasekaran, Sukumaran, Bekar, Ebru Turanoglu, Gandhi, Kanika, Roselli, Sabino Francesco, Rajashekarappa, Mohan
Format:	Preprint
Published:	2026
Subjects:	Signal Processing
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2603.11666