APA (7th ed.) Citation

Guo, X., Huang, M., & Chen, S. (2026). RASP: Reliability ab initio simulation package of MOSFETs based on all-state model.

Chicago Style (17th ed.) Citation

Guo, Xinjing, Menglin Huang, and Shiyou Chen. RASP: Reliability Ab Initio Simulation Package of MOSFETs Based on All-state Model. 2026.

MLA (9th ed.) Citation

Guo, Xinjing, et al. RASP: Reliability Ab Initio Simulation Package of MOSFETs Based on All-state Model. 2026.