Cita APA (7a ed.)

Olgun, A., Bostanci, F. N., Yuksel, I. E., Luo, H., Patel, M., Yaglikci, A. G., & Mutlu, O. (2026). DiscoRD: An Experimental Methodology for Quickly Discovering the Reliable Read Disturbance Threshold of Real DRAM Chips.

Cita Chicago Style (17a ed.)

Olgun, Ataberk, F. Nisa Bostanci, Ismail Emir Yuksel, Haocong Luo, Minesh Patel, A. Giray Yaglikci, y Onur Mutlu. DiscoRD: An Experimental Methodology for Quickly Discovering the Reliable Read Disturbance Threshold of Real DRAM Chips. 2026.

Cita MLA (9a ed.)

Olgun, Ataberk, et al. DiscoRD: An Experimental Methodology for Quickly Discovering the Reliable Read Disturbance Threshold of Real DRAM Chips. 2026.