Gespeichert in:
| Hauptverfasser: | , , , , , |
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| Format: | Preprint |
| Veröffentlicht: |
2026
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| Schlagworte: | |
| Online-Zugang: | https://arxiv.org/abs/2603.13337 |
| Tags: |
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Inhaltsangabe:
- Electroluminescence (EL) imaging is widely used to detect defects in photovoltaic (PV) modules, and machine learning methods have been applied to enable large-scale analysis of EL images. However, existing methods cannot assign multiple labels to the same pixel, limiting their ability to capture overlapping degradation features. We present a multi-channel U-Net architecture for pixel-level multi-label segmentation of EL images. The model outputs independent probability maps for cracks, busbars, dark areas, and non-cell regions, enabling accurate co-classification of interacting features such as cracks crossing busbars. The model achieved an accuracy of 98% and has been shown to generalize to unseen datasets. This framework offers a scalable, extensible tool for automated PV module inspection, improving defect quantification and lifetime prediction in large-scale PV systems.