Qubit syndrome measurements with a high fidelity Rb-Cs Rydberg gate

Fuente: arXiv
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Bibliographic Details
Main Authors: Miles, J., Lichtman, M. T., Scott, A. M., Scott, J., Norrell, S. A., Bedalov, M. J., Belknap, D. A., Cole, D. C., Eubanks, S. Y., Gillette, M., Gokhale, P., Goldwin, J., Iliev, M., Jones, R. A., Kuper, K. W., Mason, D., Mitchell, P. T., Murphree, J. D., Neff-Mallon, N. A., Noel, T. W., Radnaev, A. G., Vinogradov, I. V., Saffman, M.
Format: Preprint
Published: 2026
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