Ma, S., Jin, J., Fan, C., Wang, C., & Ai, Q. (2026). Investigating Lipkin-Meshkov-Glick Model and Criticality-Enhanced Metrology in a Coherent Ising Machine.
Chicago Style (17th ed.) CitationMa, Shuang-Quan, Jing-Yi-Ran Jin, Chen-Rui Fan, Chuan Wang, and Qing Ai. Investigating Lipkin-Meshkov-Glick Model and Criticality-Enhanced Metrology in a Coherent Ising Machine. 2026.
MLA (9th ed.) CitationMa, Shuang-Quan, et al. Investigating Lipkin-Meshkov-Glick Model and Criticality-Enhanced Metrology in a Coherent Ising Machine. 2026.
Warning: These citations may not always be 100% accurate.