Linear dichroic soft X-ray microscopy of ferroelectric stripe domains in epitaxial K$_\mathbf{0.6}$Na$_\mathbf{0.4}$NbO$_\mathbf{3}$
Fuente:
arXiv
Gespeichert in:
| Hauptverfasser: | , , , , , , , , , , , , , , , , , , , , , |
|---|---|
| Format: | Preprint |
| Veröffentlicht: |
2026
|
| Schlagworte: | |
| Online-Zugang: | |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| _version_ | 1866908886331555840 |
|---|---|
| author | Schneider, M. Butcher, T. A. Wagner, S. Metternich, D. Klose, C. Malm, E. Battistelli, R. Deinhart, V. Fuchs, J. Wittrock, S. Karaman, T. Joy, K. Puzhekadavil Patras, M. Büttner, F. Wintz, S. Weigand, M. Günther, C. M. Engel, D. Gaal, P. Schwarzkopf, J. Pfau, B. Eisebitt, S. |
| author_facet | Schneider, M. Butcher, T. A. Wagner, S. Metternich, D. Klose, C. Malm, E. Battistelli, R. Deinhart, V. Fuchs, J. Wittrock, S. Karaman, T. Joy, K. Puzhekadavil Patras, M. Büttner, F. Wintz, S. Weigand, M. Günther, C. M. Engel, D. Gaal, P. Schwarzkopf, J. Pfau, B. Eisebitt, S. |
| contents | Functional properties of ferroelectric thin films are governed by domains that can be engineered by epitaxial strain. Soft X-ray microscopy can image domain structures with elemental and electronic sensitivity, but hitherto its application to strain-stabilized domains has been hindered by the absorption of soft X-rays in epitaxial substrates. Here, it is demonstrated how this limitation can be overcome by locally back-thinning the (110) TbScO$_3$ substrate of epitaxial K$_{0.6}$Na$_{0.4}$NbO$_3$ ferroelectric thin films to achieve soft X-ray transparency at the O K-edge around 530 eV. Strain-induced ferroelectric stripe domains with periods down to 44 nm were resolved by scanning transmission X-ray microscopy and coherent diffractive imaging by exploiting the X-ray linear dichroism of hybridized O 2p-Nb 4d states, providing sensitivity to in-plane polarization components under normal incidence. The results establish soft X-ray microscopy for nanoscale imaging of epitaxial ferroelectric domains structures and open perspectives for time-resolved studies thereof. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2603_14079 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Linear dichroic soft X-ray microscopy of ferroelectric stripe domains in epitaxial K$_\mathbf{0.6}$Na$_\mathbf{0.4}$NbO$_\mathbf{3}$ Schneider, M. Butcher, T. A. Wagner, S. Metternich, D. Klose, C. Malm, E. Battistelli, R. Deinhart, V. Fuchs, J. Wittrock, S. Karaman, T. Joy, K. Puzhekadavil Patras, M. Büttner, F. Wintz, S. Weigand, M. Günther, C. M. Engel, D. Gaal, P. Schwarzkopf, J. Pfau, B. Eisebitt, S. Materials Science Mesoscale and Nanoscale Physics Functional properties of ferroelectric thin films are governed by domains that can be engineered by epitaxial strain. Soft X-ray microscopy can image domain structures with elemental and electronic sensitivity, but hitherto its application to strain-stabilized domains has been hindered by the absorption of soft X-rays in epitaxial substrates. Here, it is demonstrated how this limitation can be overcome by locally back-thinning the (110) TbScO$_3$ substrate of epitaxial K$_{0.6}$Na$_{0.4}$NbO$_3$ ferroelectric thin films to achieve soft X-ray transparency at the O K-edge around 530 eV. Strain-induced ferroelectric stripe domains with periods down to 44 nm were resolved by scanning transmission X-ray microscopy and coherent diffractive imaging by exploiting the X-ray linear dichroism of hybridized O 2p-Nb 4d states, providing sensitivity to in-plane polarization components under normal incidence. The results establish soft X-ray microscopy for nanoscale imaging of epitaxial ferroelectric domains structures and open perspectives for time-resolved studies thereof. |
| title | Linear dichroic soft X-ray microscopy of ferroelectric stripe domains in epitaxial K$_\mathbf{0.6}$Na$_\mathbf{0.4}$NbO$_\mathbf{3}$ |
| topic | Materials Science Mesoscale and Nanoscale Physics |
| url | https://arxiv.org/abs/2603.14079 |