Style de citation APA (7e éd.)

Zhang, Z. (2026). Multi-Period Texture Contrast Enhancement for Low-Contrast Wafer Defect Detection and Segmentation.

Style de citation Chicago (17e éd.)

Zhang, Zihan. Multi-Period Texture Contrast Enhancement for Low-Contrast Wafer Defect Detection and Segmentation. 2026.

Style de citation MLA (9e éd.)

Zhang, Zihan. Multi-Period Texture Contrast Enhancement for Low-Contrast Wafer Defect Detection and Segmentation. 2026.