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Ab Initio Transfer Length Method Simulations of Tunneling Limits in 2D Semiconductors

Fuente: arXiv

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Bibliographic Details
Main Authors:	Kim, Tae Hyung, Lee, Juho, Kim, Yong-Hoon
Format:	Preprint
Published:	2026
Subjects:	Mesoscale and Nanoscale Physics Materials Science
Online Access:	Acceder al recurso
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