From Artefact to Insight: Efficient Low-Rank Adaptation of BrushNet for Scanning Probe Microscopy Image Restoration

Fuente: arXiv

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Bibliographic Details
Main Authors:	Wei, Ziwei, Shen, Yao, Lu, Wanheng, Ho, Ghim Wei, Zeng, Kaiyang
Format:	Preprint
Published:	2026
Subjects:	Computer Vision and Pattern Recognition Mesoscale and Nanoscale Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2603.14850