From Artefact to Insight: Efficient Low-Rank Adaptation of BrushNet for Scanning Probe Microscopy Image Restoration
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arXiv
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| Autores principales: | , , , , |
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| Formato: | Preprint |
| Publicado: |
2026
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| _version_ | 1866911518761680896 |
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| author | Wei, Ziwei Shen, Yao Lu, Wanheng Ho, Ghim Wei Zeng, Kaiyang |
| author_facet | Wei, Ziwei Shen, Yao Lu, Wanheng Ho, Ghim Wei Zeng, Kaiyang |
| contents | Scanning Probe Microscopy or SPM offers nanoscale resolution but is frequently marred by structured artefacts such as line scan dropout, gain induced noise, tip convolution, and phase hops. While most available methods treat SPM artefact removal as isolated denoising or interpolation tasks, the generative inpainting perspective remains largely unexplored. In this work, we introduce a diffusion based inpainting framework tailored to scientific grayscale imagery. By fine tuning less than 0.2 percent of BrushNet weights with rank constrained low rank adaptation (LoRA), we adapt a pretrained diffusion model using only 7390 artefact, clean pairs distilled from 739 experimental scans. On our forthcoming public SPM InpBench benchmark, the LoRA enhanced model lifts the Peak Signal to Noise Ratio or PSNR by 6.61 dB and halves the Learned Perceptual Image Patch Similarity or LPIPS relative to zero-shot inference, while matching or slightly surpassing the accuracy of full retraining, trainable on a single GPU instead of four high-memory cards. The approach generalizes across various SPM image channels including height, amplitude and phase, faithfully restores subtle structural details, and suppresses hallucination artefacts inherited from natural image priors. This lightweight framework enables efficient, scalable recovery of irreplaceable SPM images and paves the way for a broader diffusion model adoption in nanoscopic imaging analysis. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2603_14850 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | From Artefact to Insight: Efficient Low-Rank Adaptation of BrushNet for Scanning Probe Microscopy Image Restoration Wei, Ziwei Shen, Yao Lu, Wanheng Ho, Ghim Wei Zeng, Kaiyang Computer Vision and Pattern Recognition Mesoscale and Nanoscale Physics Scanning Probe Microscopy or SPM offers nanoscale resolution but is frequently marred by structured artefacts such as line scan dropout, gain induced noise, tip convolution, and phase hops. While most available methods treat SPM artefact removal as isolated denoising or interpolation tasks, the generative inpainting perspective remains largely unexplored. In this work, we introduce a diffusion based inpainting framework tailored to scientific grayscale imagery. By fine tuning less than 0.2 percent of BrushNet weights with rank constrained low rank adaptation (LoRA), we adapt a pretrained diffusion model using only 7390 artefact, clean pairs distilled from 739 experimental scans. On our forthcoming public SPM InpBench benchmark, the LoRA enhanced model lifts the Peak Signal to Noise Ratio or PSNR by 6.61 dB and halves the Learned Perceptual Image Patch Similarity or LPIPS relative to zero-shot inference, while matching or slightly surpassing the accuracy of full retraining, trainable on a single GPU instead of four high-memory cards. The approach generalizes across various SPM image channels including height, amplitude and phase, faithfully restores subtle structural details, and suppresses hallucination artefacts inherited from natural image priors. This lightweight framework enables efficient, scalable recovery of irreplaceable SPM images and paves the way for a broader diffusion model adoption in nanoscopic imaging analysis. |
| title | From Artefact to Insight: Efficient Low-Rank Adaptation of BrushNet for Scanning Probe Microscopy Image Restoration |
| topic | Computer Vision and Pattern Recognition Mesoscale and Nanoscale Physics |
| url | https://arxiv.org/abs/2603.14850 |