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From Artefact to Insight: Efficient Low-Rank Adaptation of BrushNet for Scanning Probe Microscopy Image Restoration

Fuente: arXiv

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Dettagli Bibliografici
Autori principali:	Wei, Ziwei, Shen, Yao, Lu, Wanheng, Ho, Ghim Wei, Zeng, Kaiyang
Natura:	Preprint
Pubblicazione:	2026
Soggetti:	Computer Vision and Pattern Recognition Mesoscale and Nanoscale Physics
Accesso online:	Acceder al recurso
Tags:	Aggiungi Tag Nessun Tag, puoi essere il primo ad aggiungerne!!

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