Pansharpening for Thin-Cloud Contaminated Remote Sensing Images: A Unified Framework and Benchmark Dataset

Fuente: arXiv
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Main Authors: Du, Songcheng, Zou, Yang, Li, Jiaxin, Liu, Mingxuan, Li, Ying, Shang, Changjing, Shen, Qiang
Format: Preprint
Published: 2026
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author Du, Songcheng
Zou, Yang
Li, Jiaxin
Liu, Mingxuan
Li, Ying
Shang, Changjing
Shen, Qiang
author_facet Du, Songcheng
Zou, Yang
Li, Jiaxin
Liu, Mingxuan
Li, Ying
Shang, Changjing
Shen, Qiang
contents Pansharpening under thin cloudy conditions is a practically significant yet rarely addressed task, challenged by simultaneous spatial resolution degradation and cloud-induced spectral distortions. Existing methods often address cloud removal and pansharpening sequentially, leading to cumulative errors and suboptimal performance due to the lack of joint degradation modeling. To address these challenges, we propose a Unified Pansharpening Model with Thin Cloud Removal (Pan-TCR), an end-to-end framework that integrates physical priors. Motivated by theoretical analysis in the frequency domain, we design a frequency-decoupled restoration (FDR) block that disentangles the restoration of multispectral image (MSI) features into amplitude and phase components, each guided by complementary degradation-robust prompts: the near-infrared (NIR) band amplitude for cloud-resilient restoration, and the panchromatic (PAN) phase for high-resolution structural enhancement. To ensure coherence between the two components, we further introduce an interactive inter-frequency consistency (IFC) module, enabling cross-modal refinement that enforces consistency and robustness across frequency cues. Furthermore, we introduce the first real-world thin-cloud contaminated pansharpening dataset (PanTCR-GF2), comprising paired clean and cloudy PAN-MSI images, to enable robust benchmarking under realistic conditions. Extensive experiments on real-world and synthetic datasets demonstrate the superiority and robustness of Pan-TCR, establishing a new benchmark for pansharpening under realistic atmospheric degradations.
format Preprint
id arxiv_https___arxiv_org_abs_2603_14952
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Pansharpening for Thin-Cloud Contaminated Remote Sensing Images: A Unified Framework and Benchmark Dataset
Du, Songcheng
Zou, Yang
Li, Jiaxin
Liu, Mingxuan
Li, Ying
Shang, Changjing
Shen, Qiang
Computer Vision and Pattern Recognition
Pansharpening under thin cloudy conditions is a practically significant yet rarely addressed task, challenged by simultaneous spatial resolution degradation and cloud-induced spectral distortions. Existing methods often address cloud removal and pansharpening sequentially, leading to cumulative errors and suboptimal performance due to the lack of joint degradation modeling. To address these challenges, we propose a Unified Pansharpening Model with Thin Cloud Removal (Pan-TCR), an end-to-end framework that integrates physical priors. Motivated by theoretical analysis in the frequency domain, we design a frequency-decoupled restoration (FDR) block that disentangles the restoration of multispectral image (MSI) features into amplitude and phase components, each guided by complementary degradation-robust prompts: the near-infrared (NIR) band amplitude for cloud-resilient restoration, and the panchromatic (PAN) phase for high-resolution structural enhancement. To ensure coherence between the two components, we further introduce an interactive inter-frequency consistency (IFC) module, enabling cross-modal refinement that enforces consistency and robustness across frequency cues. Furthermore, we introduce the first real-world thin-cloud contaminated pansharpening dataset (PanTCR-GF2), comprising paired clean and cloudy PAN-MSI images, to enable robust benchmarking under realistic conditions. Extensive experiments on real-world and synthetic datasets demonstrate the superiority and robustness of Pan-TCR, establishing a new benchmark for pansharpening under realistic atmospheric degradations.
title Pansharpening for Thin-Cloud Contaminated Remote Sensing Images: A Unified Framework and Benchmark Dataset
topic Computer Vision and Pattern Recognition
url https://arxiv.org/abs/2603.14952