Characterization of Passive CMOS Strip Detectors After Proton Irradiation

Fuente: arXiv
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Auteurs principaux: Baselga, Marta, Arling, Jan-Hendrik, Davis, Naomi, Dingfelder, Jochen, Gregor, Ingrid Maria, Hauser, Marc, Hügging, Fabian, Jakobs, Karl, Karagounis, Michael, Koppenhöfer, Roland, Kroeninger, Kevin Alexander, Lex, Fabian, Parzefall, Ulrich, Spannagel, Simon, Sperlich, Dennis, Weingarten, Jens, Zatocilova, Iveta
Format: Preprint
Publié: 2026
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author Baselga, Marta
Arling, Jan-Hendrik
Davis, Naomi
Dingfelder, Jochen
Gregor, Ingrid Maria
Hauser, Marc
Hügging, Fabian
Jakobs, Karl
Karagounis, Michael
Koppenhöfer, Roland
Kroeninger, Kevin Alexander
Lex, Fabian
Parzefall, Ulrich
Spannagel, Simon
Sperlich, Dennis
Weingarten, Jens
Zatocilova, Iveta
author_facet Baselga, Marta
Arling, Jan-Hendrik
Davis, Naomi
Dingfelder, Jochen
Gregor, Ingrid Maria
Hauser, Marc
Hügging, Fabian
Jakobs, Karl
Karagounis, Michael
Koppenhöfer, Roland
Kroeninger, Kevin Alexander
Lex, Fabian
Parzefall, Ulrich
Spannagel, Simon
Sperlich, Dennis
Weingarten, Jens
Zatocilova, Iveta
contents Strip detectors are populating outer trackers of high-energy particle experiments. They are convenient for covering large areas of sensitive material since they use less power and have fewer readout channels compared to pixels sensors. Nevertheless, they are typically manufactured with a mask set that covers the full wafer, otherwise when using smaller reticles the strip implants have to be stitched. For this project, strip detectors were fabricated in a CMOS commercial foundry using different reticles to be stitched several times, proving the feasibility of this technology. LFoundry produced the passive CMOS strip detector with a production line of 150 nm node technology, using a 150 um thick FZ wafer. Those strip sensors have three different geometries to study different impacts of the CMOS technology. The strips have lengths of 2.1 cm and 4.1 cm, stitching 3 or 5 reticles respectively. This work shows results of 24 GeV proton irradiated passive CMOS strip detectors. The detectors were irradiated at CERN and were tested with different set-ups, not showing any effect from the strips stitching. Proving that this technology is feasible for detecting high-energy particles opens the door to future large productions of passive strip detectors and also to produce active strip sensors in commercial CMOS foundries.
format Preprint
id arxiv_https___arxiv_org_abs_2603_15524
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Characterization of Passive CMOS Strip Detectors After Proton Irradiation
Baselga, Marta
Arling, Jan-Hendrik
Davis, Naomi
Dingfelder, Jochen
Gregor, Ingrid Maria
Hauser, Marc
Hügging, Fabian
Jakobs, Karl
Karagounis, Michael
Koppenhöfer, Roland
Kroeninger, Kevin Alexander
Lex, Fabian
Parzefall, Ulrich
Spannagel, Simon
Sperlich, Dennis
Weingarten, Jens
Zatocilova, Iveta
Instrumentation and Detectors
High Energy Physics - Experiment
Strip detectors are populating outer trackers of high-energy particle experiments. They are convenient for covering large areas of sensitive material since they use less power and have fewer readout channels compared to pixels sensors. Nevertheless, they are typically manufactured with a mask set that covers the full wafer, otherwise when using smaller reticles the strip implants have to be stitched. For this project, strip detectors were fabricated in a CMOS commercial foundry using different reticles to be stitched several times, proving the feasibility of this technology. LFoundry produced the passive CMOS strip detector with a production line of 150 nm node technology, using a 150 um thick FZ wafer. Those strip sensors have three different geometries to study different impacts of the CMOS technology. The strips have lengths of 2.1 cm and 4.1 cm, stitching 3 or 5 reticles respectively. This work shows results of 24 GeV proton irradiated passive CMOS strip detectors. The detectors were irradiated at CERN and were tested with different set-ups, not showing any effect from the strips stitching. Proving that this technology is feasible for detecting high-energy particles opens the door to future large productions of passive strip detectors and also to produce active strip sensors in commercial CMOS foundries.
title Characterization of Passive CMOS Strip Detectors After Proton Irradiation
topic Instrumentation and Detectors
High Energy Physics - Experiment
url https://arxiv.org/abs/2603.15524