Wang, Y., Ma, Z., Chen, P., Fang, S., Liu, Y., Yam, Y. C., . . . Hoffman, J. E. (2026). Probing the Penetration Depth of Topological Surface States by Magnetic Impurity Scattering in V-doped Sb$_2$Te$_3$.
Chicago Style (17th ed.) CitationWang, Yidi, et al. Probing the Penetration Depth of Topological Surface States by Magnetic Impurity Scattering in V-doped Sb$_2$Te$_3$. 2026.
MLA (9th ed.) CitationWang, Yidi, et al. Probing the Penetration Depth of Topological Surface States by Magnetic Impurity Scattering in V-doped Sb$_2$Te$_3$. 2026.
Warning: These citations may not always be 100% accurate.