Fast random sampling and small noise analysis for stochastic control models

Fuente: arXiv

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Bibliographic Details
Main Authors:	Iyer, Sarvesh Ravichandran, Kumar, Vivek
Format:	Preprint
Published:	2026
Subjects:	Probability 60H10, 93E03, 34F05 (Primary) 60F05, 60G99, 60K20 (Secondary)
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2603.16399