Xie, Y., Lei, M., Dong, W., & Shi, M. (2026). Optical Chopping Enhanced Rydberg-Atom-Based Ultra-Low-Frequency Electric Field Measurement.
Chicago Style (17th ed.) CitationXie, Yipeng, Mingwei Lei, Wenbo Dong, and Meng Shi. Optical Chopping Enhanced Rydberg-Atom-Based Ultra-Low-Frequency Electric Field Measurement. 2026.
MLA (9th ed.) CitationXie, Yipeng, et al. Optical Chopping Enhanced Rydberg-Atom-Based Ultra-Low-Frequency Electric Field Measurement. 2026.
Warning: These citations may not always be 100% accurate.