SAMSEM -- A Generic and Scalable Approach for IC Metal Line Segmentation

Fuente: arXiv

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Bibliographic Details
Main Authors:	Gehrmann, Christian, Ricker, Jonas, Damm, Simon, Cheng, Deruo, Speith, Julian, Shi, Yiqiong, Fischer, Asja, Paar, Christof
Format:	Preprint
Published:	2026
Subjects:	Cryptography and Security Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2603.16548