Bridging the Simulation-to-Reality Gap in Electron Microscope Calibration via VAE-EM Estimation

Fuente: arXiv

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Bibliographic Details
Main Authors:	van Hulst, Jilles S., Heemels, W. P. M. H., Antunes, Duarte J.
Format:	Preprint
Published:	2026
Subjects:	Computer Vision and Pattern Recognition Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2603.16549