Omni IIE Bench: Benchmarking the Practical Capabilities of Image Editing Models

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Hauptverfasser: Yang, Yujia, Wang, Yuanxiang, Guan, Zhenyu, Yang, Tiankun, Bao, Chenxi, Jin, Haopeng, Luo, Jinwen, Zuo, Xinyu, Duan, Lisheng, Liang, Haijin, Ma, Jin, Wang, Xinming, Tao, Ruiwen, Yi, Hongzhu
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Veröffentlicht: 2026
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author Yang, Yujia
Wang, Yuanxiang
Guan, Zhenyu
Yang, Tiankun
Bao, Chenxi
Jin, Haopeng
Luo, Jinwen
Zuo, Xinyu
Duan, Lisheng
Liang, Haijin
Ma, Jin
Wang, Xinming
Tao, Ruiwen
Yi, Hongzhu
author_facet Yang, Yujia
Wang, Yuanxiang
Guan, Zhenyu
Yang, Tiankun
Bao, Chenxi
Jin, Haopeng
Luo, Jinwen
Zuo, Xinyu
Duan, Lisheng
Liang, Haijin
Ma, Jin
Wang, Xinming
Tao, Ruiwen
Yi, Hongzhu
contents While Instruction-based Image Editing (IIE) has achieved significant progress, existing benchmarks pursue task breadth via mixed evaluations. This paradigm obscures a critical failure mode crucial in professional applications: the inconsistent performance of models across tasks of varying semantic scales. To address this gap, we introduce Omni IIE Bench, a high-quality, human-annotated benchmark specifically designed to diagnose the editing consistency of IIE models in practical application scenarios. Omni IIE Bench features an innovative dual-track diagnostic design: (1) Single-turn Consistency, comprising shared-context task pairs of attribute modification and entity replacement; and (2) Multi-turn Coordination, involving continuous dialogue tasks that traverse semantic scales. The benchmark is constructed via an exceptionally rigorous multi-stage human filtering process, incorporating a quality standard enforced by computer vision graduate students and an industry relevance review conducted by professional designers. We perform a comprehensive evaluation of 8 mainstream IIE models using Omni IIE Bench. Our analysis quantifies, for the first time, a prevalent performance gap: nearly all models exhibit a significant performance degradation when transitioning from low-semantic-scale to high-semantic-scale tasks. Omni IIE Bench provides critical diagnostic tools and insights for the development of next-generation, more reliable, and stable IIE models.
format Preprint
id arxiv_https___arxiv_org_abs_2603_16944
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Omni IIE Bench: Benchmarking the Practical Capabilities of Image Editing Models
Yang, Yujia
Wang, Yuanxiang
Guan, Zhenyu
Yang, Tiankun
Bao, Chenxi
Jin, Haopeng
Luo, Jinwen
Zuo, Xinyu
Duan, Lisheng
Liang, Haijin
Ma, Jin
Wang, Xinming
Tao, Ruiwen
Yi, Hongzhu
Computer Vision and Pattern Recognition
Artificial Intelligence
While Instruction-based Image Editing (IIE) has achieved significant progress, existing benchmarks pursue task breadth via mixed evaluations. This paradigm obscures a critical failure mode crucial in professional applications: the inconsistent performance of models across tasks of varying semantic scales. To address this gap, we introduce Omni IIE Bench, a high-quality, human-annotated benchmark specifically designed to diagnose the editing consistency of IIE models in practical application scenarios. Omni IIE Bench features an innovative dual-track diagnostic design: (1) Single-turn Consistency, comprising shared-context task pairs of attribute modification and entity replacement; and (2) Multi-turn Coordination, involving continuous dialogue tasks that traverse semantic scales. The benchmark is constructed via an exceptionally rigorous multi-stage human filtering process, incorporating a quality standard enforced by computer vision graduate students and an industry relevance review conducted by professional designers. We perform a comprehensive evaluation of 8 mainstream IIE models using Omni IIE Bench. Our analysis quantifies, for the first time, a prevalent performance gap: nearly all models exhibit a significant performance degradation when transitioning from low-semantic-scale to high-semantic-scale tasks. Omni IIE Bench provides critical diagnostic tools and insights for the development of next-generation, more reliable, and stable IIE models.
title Omni IIE Bench: Benchmarking the Practical Capabilities of Image Editing Models
topic Computer Vision and Pattern Recognition
Artificial Intelligence
url https://arxiv.org/abs/2603.16944