Interpretable AI-Assisted Early Reliability Prediction for a Two-Parameter Parallel Root-Finding Scheme

Fuente: arXiv

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Bibliographic Details
Main Authors:	Carpentieri, Bruno, Velichko, Andrei, Shams, Mudassir, Lecca, Paola
Format:	Preprint
Published:	2026
Subjects:	Numerical Analysis Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2603.16980