LED: A Benchmark for Evaluating Layout Error Detection in Document Analysis

Fuente: arXiv

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Bibliographic Details
Main Authors:	Heo, Inbum, Hwang, Taewook, Jung, Jeesu, Jung, Sangkeun
Format:	Preprint
Published:	2026
Subjects:	Computer Vision and Pattern Recognition Computation and Language
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2603.17265