Dropout Robustness and Cognitive Profiling of Transformer Models via Stochastic Inference

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Caiado, Antônio Junior Alves, Hahsler, Michael
Format: Preprint
Published: 2026
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!