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Main Authors: Rodriguez, Sebastian, Tannous, Mikhael, Mounayer, Jad, Cruz, Camilo, Barasinski, Anais, Chinesta, Francisco
Format: Preprint
Published: 2026
Subjects:
Online Access:https://arxiv.org/abs/2603.20418
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author Rodriguez, Sebastian
Tannous, Mikhael
Mounayer, Jad
Cruz, Camilo
Barasinski, Anais
Chinesta, Francisco
author_facet Rodriguez, Sebastian
Tannous, Mikhael
Mounayer, Jad
Cruz, Camilo
Barasinski, Anais
Chinesta, Francisco
contents Unidirectional tapes surface roughness determines the evolution of the degree of intimate contact required for ensuring the thermoplastic molecular diffusion and the associated inter-tapes consolidation during manufacturing of composite structures. However, usual characterization of rough surfaces relies on statistical descriptors that even if they are able to represent the surface topology, they are not necessarily connected with the physics occurring at the interface during inter-tape consolidation. Thus, a key research question could be formulated as follows: Which roughness descriptors simultaneously enable tape classification-crucial for process control-and consolidation modeling via the inference of the evolution of the degree of intimate contact, itself governed by the process parameters?. For providing a valuable response, we propose a novel strategy based on the use of Rank Reduction Autoencoders (RRAEs), autoencoders with a linear latent vector space enforced by applying a truncated Singular Value Decomposition (SVD) to the latent matrix during the encoder-decoder training. In this work, we extract useful roughness descriptors by enforcing the latent SVD modes to (i) accurately represent the roughness after decoding, and (ii) allow the extraction of existing a priori knowledge such as classification or modelling properties.
format Preprint
id arxiv_https___arxiv_org_abs_2603_20418
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Data-driven discovery of roughness descriptors for surface characterization and intimate contact modeling of unidirectional composite tapes
Rodriguez, Sebastian
Tannous, Mikhael
Mounayer, Jad
Cruz, Camilo
Barasinski, Anais
Chinesta, Francisco
Machine Learning
Numerical Analysis
Unidirectional tapes surface roughness determines the evolution of the degree of intimate contact required for ensuring the thermoplastic molecular diffusion and the associated inter-tapes consolidation during manufacturing of composite structures. However, usual characterization of rough surfaces relies on statistical descriptors that even if they are able to represent the surface topology, they are not necessarily connected with the physics occurring at the interface during inter-tape consolidation. Thus, a key research question could be formulated as follows: Which roughness descriptors simultaneously enable tape classification-crucial for process control-and consolidation modeling via the inference of the evolution of the degree of intimate contact, itself governed by the process parameters?. For providing a valuable response, we propose a novel strategy based on the use of Rank Reduction Autoencoders (RRAEs), autoencoders with a linear latent vector space enforced by applying a truncated Singular Value Decomposition (SVD) to the latent matrix during the encoder-decoder training. In this work, we extract useful roughness descriptors by enforcing the latent SVD modes to (i) accurately represent the roughness after decoding, and (ii) allow the extraction of existing a priori knowledge such as classification or modelling properties.
title Data-driven discovery of roughness descriptors for surface characterization and intimate contact modeling of unidirectional composite tapes
topic Machine Learning
Numerical Analysis
url https://arxiv.org/abs/2603.20418