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Testing and Characterization of Wafer-Scale MAPS Prototypes for the ALICE ITS3 Upgrade

Fuente: arXiv

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Détails bibliographiques
Auteur principal:	Tiltmann, Nicolas
Format:	Preprint
Publié:	2026
Sujets:	Instrumentation and Detectors
Accès en ligne:	Acceder al recurso
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