Gate-Drain Leakage Enhanced by Drain-Induced Dielectric Barrier Lowering in Gate-All-Around Field Effect Transistors

Fuente: arXiv

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Bibliographic Details
Main Authors:	Mendez, Juan P., Cariker, Coleman, Titze, Michael, Belianinov, Alex A., Mamaluy, Denis
Format:	Preprint
Published:	2026
Subjects:	Other Condensed Matter
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2603.21015