Characterization and Comparison of Energy Relaxation in Fluxonium Qubits

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Hauptverfasser: Azar, Kate, Ateshian, Lamia, Randeria, Mallika T., Piñero, Renée DePencier, Gertler, Jeffrey M., An, Junyoung, Contipelli, Felipe, Ding, Leon, Gingras, Michael, Grossklaus, Kevin, Hays, Max, Hazard, Thomas M., Kim, Junghyun, Niedzielski, Bethany M., Stickler, Hannah, Tiwari, Kunal L., Zhang, Helin, Grover, Jeffrey A., Yoder, Jonilyn L., Schwartz, Mollie E., Oliver, William D., Serniak, Kyle
Format: Preprint
Veröffentlicht: 2026
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author Azar, Kate
Ateshian, Lamia
Randeria, Mallika T.
Piñero, Renée DePencier
Gertler, Jeffrey M.
An, Junyoung
Contipelli, Felipe
Ding, Leon
Gingras, Michael
Grossklaus, Kevin
Hays, Max
Hazard, Thomas M.
Kim, Junghyun
Niedzielski, Bethany M.
Stickler, Hannah
Tiwari, Kunal L.
Zhang, Helin
Grover, Jeffrey A.
Yoder, Jonilyn L.
Schwartz, Mollie E.
Oliver, William D.
Serniak, Kyle
author_facet Azar, Kate
Ateshian, Lamia
Randeria, Mallika T.
Piñero, Renée DePencier
Gertler, Jeffrey M.
An, Junyoung
Contipelli, Felipe
Ding, Leon
Gingras, Michael
Grossklaus, Kevin
Hays, Max
Hazard, Thomas M.
Kim, Junghyun
Niedzielski, Bethany M.
Stickler, Hannah
Tiwari, Kunal L.
Zhang, Helin
Grover, Jeffrey A.
Yoder, Jonilyn L.
Schwartz, Mollie E.
Oliver, William D.
Serniak, Kyle
contents Fluxonium superconducting qubits have demonstrated long coherence times and high single- and two-qubit gate fidelities, making them a favorable building block for superconducting quantum processors. We investigate the dominant limitations to fluxonium qubit energy relaxation time $T_1$ using a set of eight planar, aluminum-on-silicon qubits. We find that a circuit-based model for capacitive dielectric loss best captures the frequency dependence of $T_1$, which we analyze within both a two-level and a six-level energy relaxation model. We convert the measured $T_1$ into an effective capacitive quality factor $Q_\mathrm{C}^{\mathrm{eff}}$ to compare qubits on equal footing, accounting for independently estimated contributions from $1/f$ flux noise and radiative loss to the control and readout circuitry. We apply this methodology to compare qubits from two fabrication processes: a baseline process and one that applies a fluorine-based wet treatment prior to Josephson junction deposition. We resolve a small improvement of (13.8 $\pm$ 8.4$)\%$ in the process mean $Q_\mathrm{C}^{\mathrm{eff}}$, indicating that the fluorine treatment may have reduced loss from the metal-substrate interface, but did not address the primary source of loss in these fluxonium qubits.
format Preprint
id arxiv_https___arxiv_org_abs_2603_23636
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Characterization and Comparison of Energy Relaxation in Fluxonium Qubits
Azar, Kate
Ateshian, Lamia
Randeria, Mallika T.
Piñero, Renée DePencier
Gertler, Jeffrey M.
An, Junyoung
Contipelli, Felipe
Ding, Leon
Gingras, Michael
Grossklaus, Kevin
Hays, Max
Hazard, Thomas M.
Kim, Junghyun
Niedzielski, Bethany M.
Stickler, Hannah
Tiwari, Kunal L.
Zhang, Helin
Grover, Jeffrey A.
Yoder, Jonilyn L.
Schwartz, Mollie E.
Oliver, William D.
Serniak, Kyle
Quantum Physics
Mesoscale and Nanoscale Physics
Fluxonium superconducting qubits have demonstrated long coherence times and high single- and two-qubit gate fidelities, making them a favorable building block for superconducting quantum processors. We investigate the dominant limitations to fluxonium qubit energy relaxation time $T_1$ using a set of eight planar, aluminum-on-silicon qubits. We find that a circuit-based model for capacitive dielectric loss best captures the frequency dependence of $T_1$, which we analyze within both a two-level and a six-level energy relaxation model. We convert the measured $T_1$ into an effective capacitive quality factor $Q_\mathrm{C}^{\mathrm{eff}}$ to compare qubits on equal footing, accounting for independently estimated contributions from $1/f$ flux noise and radiative loss to the control and readout circuitry. We apply this methodology to compare qubits from two fabrication processes: a baseline process and one that applies a fluorine-based wet treatment prior to Josephson junction deposition. We resolve a small improvement of (13.8 $\pm$ 8.4$)\%$ in the process mean $Q_\mathrm{C}^{\mathrm{eff}}$, indicating that the fluorine treatment may have reduced loss from the metal-substrate interface, but did not address the primary source of loss in these fluxonium qubits.
title Characterization and Comparison of Energy Relaxation in Fluxonium Qubits
topic Quantum Physics
Mesoscale and Nanoscale Physics
url https://arxiv.org/abs/2603.23636