Distributionally Robust $k$-of-$n$ Sequential Testing
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arXiv
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| Format: | Preprint |
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2026
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| author | Tan, Rayen Nagarajan, Viswanath |
| author_facet | Tan, Rayen Nagarajan, Viswanath |
| contents | The $k$-of-$n$ testing problem involves performing $n$ independent tests sequentially, in order to determine whether/not at least $k$ tests pass. The objective is to minimize the expected cost of testing. This is a fundamental and well-studied stochastic optimization problem. However, a key limitation of this model is that the success/failure probability of each test is assumed to be known precisely. In this paper, we relax this assumption and study a distributionally-robust model for $k$-of-$n$ testing. In our setting, each test is associated with an interval that contains its (unknown) failure probability. The goal is to find a solution that minimizes the worst-case expected cost, where each test's probability is chosen from its interval. We focus on non-adaptive solutions, that are specified by a fixed permutation of the tests. When all test costs are unit, we obtain a $2$-approximation algorithm for distributionally-robust $k$-of-$n$ testing. For general costs, we obtain an $O(\frac{1}{\sqrt ε})$-approximation algorithm on $ε$-bounded instances where each uncertainty interval is contained in $[ε, 1-ε]$. We also consider the inner maximization problem for distributionally-robust $k$-of-$n$: this involves finding the worst-case probabilities from the uncertainty intervals for a given solution. For this problem, in addition to the above approximation ratios, we obtain a quasi-polynomial time approximation scheme under the assumption that all costs are polynomially bounded. |
| format | Preprint |
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arxiv_https___arxiv_org_abs_2603_23705 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Distributionally Robust $k$-of-$n$ Sequential Testing Tan, Rayen Nagarajan, Viswanath Data Structures and Algorithms The $k$-of-$n$ testing problem involves performing $n$ independent tests sequentially, in order to determine whether/not at least $k$ tests pass. The objective is to minimize the expected cost of testing. This is a fundamental and well-studied stochastic optimization problem. However, a key limitation of this model is that the success/failure probability of each test is assumed to be known precisely. In this paper, we relax this assumption and study a distributionally-robust model for $k$-of-$n$ testing. In our setting, each test is associated with an interval that contains its (unknown) failure probability. The goal is to find a solution that minimizes the worst-case expected cost, where each test's probability is chosen from its interval. We focus on non-adaptive solutions, that are specified by a fixed permutation of the tests. When all test costs are unit, we obtain a $2$-approximation algorithm for distributionally-robust $k$-of-$n$ testing. For general costs, we obtain an $O(\frac{1}{\sqrt ε})$-approximation algorithm on $ε$-bounded instances where each uncertainty interval is contained in $[ε, 1-ε]$. We also consider the inner maximization problem for distributionally-robust $k$-of-$n$: this involves finding the worst-case probabilities from the uncertainty intervals for a given solution. For this problem, in addition to the above approximation ratios, we obtain a quasi-polynomial time approximation scheme under the assumption that all costs are polynomially bounded. |
| title | Distributionally Robust $k$-of-$n$ Sequential Testing |
| topic | Data Structures and Algorithms |
| url | https://arxiv.org/abs/2603.23705 |