Visible Spectral-Domain Optical Coherence Tomography for Photonic Integrated Circuits Characterization
Fuente:
arXiv
Guardado en:
| Autores principales: | , , , , , , |
|---|---|
| Formato: | Preprint |
| Publicado: |
2026
|
| Materias: | |
| Acceso en línea: | |
| Etiquetas: |
Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
|
| _version_ | 1866914420379090944 |
|---|---|
| author | Goh, Yin Min Li, Chao Hwang, Yunchan Flores, Helaman Mehrabad, Mahmoud Jalali Fujimoto, James G. Englund, Dirk R. |
| author_facet | Goh, Yin Min Li, Chao Hwang, Yunchan Flores, Helaman Mehrabad, Mahmoud Jalali Fujimoto, James G. Englund, Dirk R. |
| contents | Visible photonic integrated circuits underpin applications ranging from AR/VR to quantum control, yet lack a high-resolution, nondestructive diagnostic comparable to the optical frequency-domain reflectometry used in infrared silicon photonics. Here we adapt spectral-domain optical coherence tomography to measure guided-mode back-reflections in visible PICs. Broadband visible light injected into a circuit generates back-reflections that interfere with a depth-referencing local oscillator, and the resulting spectral fringes are recorded on a spectrometer. We validate the approach by resolving multiple round-trip echoes in a waveguide-coupled ring resonator using only single-port access. We then extend it to circuits integrated with diamond quantum micro-chiplets, clearly resolving input and output facets as well as PIC--QMC transition regions. The system achieves shot-noise-limited sensitivity, 50 dB dynamic range, 8 um axial resolution in silicon nitride, and a 2 mm imaging depth at 6 dB roll-off. SD-OCT therefore provides a practical, high-resolution diagnostic for visible PICs that uses a broadband probe source and requires only single-port optical access, enabling rapid characterization of propagation loss, backscattering, and dispersion. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2603_23815 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Visible Spectral-Domain Optical Coherence Tomography for Photonic Integrated Circuits Characterization Goh, Yin Min Li, Chao Hwang, Yunchan Flores, Helaman Mehrabad, Mahmoud Jalali Fujimoto, James G. Englund, Dirk R. Optics Applied Physics Visible photonic integrated circuits underpin applications ranging from AR/VR to quantum control, yet lack a high-resolution, nondestructive diagnostic comparable to the optical frequency-domain reflectometry used in infrared silicon photonics. Here we adapt spectral-domain optical coherence tomography to measure guided-mode back-reflections in visible PICs. Broadband visible light injected into a circuit generates back-reflections that interfere with a depth-referencing local oscillator, and the resulting spectral fringes are recorded on a spectrometer. We validate the approach by resolving multiple round-trip echoes in a waveguide-coupled ring resonator using only single-port access. We then extend it to circuits integrated with diamond quantum micro-chiplets, clearly resolving input and output facets as well as PIC--QMC transition regions. The system achieves shot-noise-limited sensitivity, 50 dB dynamic range, 8 um axial resolution in silicon nitride, and a 2 mm imaging depth at 6 dB roll-off. SD-OCT therefore provides a practical, high-resolution diagnostic for visible PICs that uses a broadband probe source and requires only single-port optical access, enabling rapid characterization of propagation loss, backscattering, and dispersion. |
| title | Visible Spectral-Domain Optical Coherence Tomography for Photonic Integrated Circuits Characterization |
| topic | Optics Applied Physics |
| url | https://arxiv.org/abs/2603.23815 |