Revealing Charge Transfer in Defect-Engineered 4H$_\mathrm{b}$-TaS$_2$

Fuente: arXiv

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Bibliographic Details
Main Authors:	Karbasizadeh, Siavash, Yang, Wooin, Ko, Wonhee, Zhou, Haidong, Li, An-Ping, Berlijn, Tom, Mu, Sai
Format:	Preprint
Published:	2026
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2603.24486