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Beam Test Characterization of Silicon Microstrip Detector Flight-Model Ladders for the AMS-02 Upgrade

Fuente: arXiv
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Bibliographic Details
Main Authors: Miao, Dexing, Ambrosi, Giovanni, Barbanera, Mattia, Batsukh, Baasansuren, Cai, Hengyi, Cai, Mengke, Cai, Xudong, Cai, Yuman, Chang, Yuan-Hann, Chen, Shanzhen, Chou, Hsin-Yi, Cui, Xingzhu, Dong, Mingyi, Duranti, Matteo, Gong, Ke, Feng, Mingjie, Formato, Valerio, Fu, Yisheng, Hong, Daojin, Ionica, Maria, Jiang, Xiaojie, Jiang, Yaozu, Jin, Liangchenglong, Jin, Shengjie, Koutsenko, Vladimir, Li, Qinze, Li, Tiange, Li, Zuhao, Lin, Chih-Hsun, Liu, Changcheng, Liu, Cong, Liu, Hanbing, Liu, Pingcheng, Oliva, Alberto, Peng, Ji, Peng, Wenxi, Qiao, Rui, Sheng, Shuqi, Shi, Tianyu, Silvestre, Gianluigi, Sun, Zetong, Wang, Congcong, Wang, Feng, Wang, Hongbo, Wang, Zhijie, Wu, Zibing, Xiang, Zhiyu, Xiao, Suyu, Xu, Weiwei, Yan, Zixuan, Yang, Haotian, Yang, Sheng, You, Yuhang, Yuan, Xuhao, Yuan, Yuan, Zhang, Fengze, Zhang, Xiyuan, Xu, Zijun, Wang, Jianchun
Format: Preprint
Published: 2026
Subjects:
Instrumentation and Detectors
Online Access:
Acceder al recurso
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