EPAR: Electromagnetic Pathways to Architectural Reliability in Quantum Processors
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arXiv
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| Autori principali: | , , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2026
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| Soggetti: | |
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| _version_ | 1866908915834290176 |
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| author | Choudhury, Navnil Tan, Yizhuo Yu, Jiaqi Szefer, Jakub Basu, Kanad |
| author_facet | Choudhury, Navnil Tan, Yizhuo Yu, Jiaqi Szefer, Jakub Basu, Kanad |
| contents | As superconducting processors scale, understanding how physical layout shapes qubit interactions is essential for architectural reliability. Existing methods offer limited insight into how electromagnetic design choices translate into execution-level behavior. We present EPAR, an electromagnetic-to-architecture framework that predicts robustness early directly from physical design by reconstructing how design distortion modifies the effective Hamiltonian, reroutes mediated connectivity, and influences control-pulse response. Across all tested layouts, EPAR's structural scores show 100% agreement with two-qubit error trends yet reveal over 10X robustness differences among edges with identical calibrated error rates, going beyond conventional metrics to provide improved and actionable compiler guidance. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2603_25671 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | EPAR: Electromagnetic Pathways to Architectural Reliability in Quantum Processors Choudhury, Navnil Tan, Yizhuo Yu, Jiaqi Szefer, Jakub Basu, Kanad Emerging Technologies As superconducting processors scale, understanding how physical layout shapes qubit interactions is essential for architectural reliability. Existing methods offer limited insight into how electromagnetic design choices translate into execution-level behavior. We present EPAR, an electromagnetic-to-architecture framework that predicts robustness early directly from physical design by reconstructing how design distortion modifies the effective Hamiltonian, reroutes mediated connectivity, and influences control-pulse response. Across all tested layouts, EPAR's structural scores show 100% agreement with two-qubit error trends yet reveal over 10X robustness differences among edges with identical calibrated error rates, going beyond conventional metrics to provide improved and actionable compiler guidance. |
| title | EPAR: Electromagnetic Pathways to Architectural Reliability in Quantum Processors |
| topic | Emerging Technologies |
| url | https://arxiv.org/abs/2603.25671 |