Huang, H., Chen, Y., & Scott, M. (2026). Bayesian Deep Count Regression and Anomaly Detection: Evidence from GDELT Event Panels.
Style de citation Chicago (17e éd.)Huang, Hsin-Hsiung, Yuh-Haur Chen, et Mahlon Scott. Bayesian Deep Count Regression and Anomaly Detection: Evidence from GDELT Event Panels. 2026.
Style de citation MLA (9e éd.)Huang, Hsin-Hsiung, et al. Bayesian Deep Count Regression and Anomaly Detection: Evidence from GDELT Event Panels. 2026.
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