APA (7th ed.) Citation

Wriedt, N., McGlone, J., Orlandini, D., & Rajan, S. (2026). Electrostatic Effects of Self Trapped Holes in Gallium Oxide Devices.

Chicago Style (17th ed.) Citation

Wriedt, Nathan, Joe McGlone, Davide Orlandini, and Siddharth Rajan. Electrostatic Effects of Self Trapped Holes in Gallium Oxide Devices. 2026.

MLA (9th ed.) Citation

Wriedt, Nathan, et al. Electrostatic Effects of Self Trapped Holes in Gallium Oxide Devices. 2026.