Integration and characterization of Readout Electronics System for dN/dx Measurement with Drift Chamber Prototype

Fuente: arXiv
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Bibliographic Details
Main Authors: Cai, Dongcheng, Li, Qicai, Dong, Mingyi, Gong, Weile, Ji, Mengyang, Liu, Hongbin, Pan, Wenyu, Wu, Linghui, Xu, Dewei, Yuan, Yimie, Zhang, Hongyu, Zhao, Guang, Zhao, Yubin
Format: Preprint
Published: 2026
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