Bright Spot Characterization of Low dI/dt X-pinch Plasmas using Soft X-ray Spectroscopy with Bennett Relation
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| Main Authors: | , , , , , , , , , , |
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| Format: | Preprint |
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2026
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| _version_ | 1866910084267769856 |
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| author | Choi, YeongHwan Cha, Muhyeop Lee, Hakmin Chi, Hsiao-Chien Choi, Seongmin Bong, Seungmin Jeon, Seonghun Choi, Ookjin Ghim, Young-chul Hwang, Yong-Seok Chung, Kyoung-Jae |
| author_facet | Choi, YeongHwan Cha, Muhyeop Lee, Hakmin Chi, Hsiao-Chien Choi, Seongmin Bong, Seungmin Jeon, Seonghun Choi, Ookjin Ghim, Young-chul Hwang, Yong-Seok Chung, Kyoung-Jae |
| contents | This study investigates the characteristics of X-pinch plasmas driven under low current rise rate ($dI/dt$) conditions using soft x-ray spectroscopy combined with the Bennett relation. X-pinch experiments were conducted on the SNU X-pinch device using copper wires at a low $dI/dt$ of 0.2-0.3 kA/ns. The resulting 1-10 keV soft x-ray signals, measured by an x-ray filtered AXUV photodiode array (XFPA), exhibit significant nonlinear effects due to the high intensity of the soft x-ray pulses. This work characterizes the nonlinear behavior of the AXUV-HS5 Si PIN photodiodes under intense pulsed radiation using a pulsed laser. We identified a charge conservation property that the total collected charge remains proportional to the incident pulse energy despite temporal profile distortion. Based on this diagnostic finding, we developed and applied a new framework for plasma parameter estimation. By combining a spherical emission model with the Bennett equilibrium, this approach determines that the soft x-ray source plasma is a 'bright spot', characterized by a plasma density $n_e \sim 10^{21} \text{ cm}^{-3}$, size $d \sim 30-40\ μ\text{m}$, electron temperature $T_e \sim 1 \text{ keV}$, and an emission duration $t_B \sim 1 \text{ ns}$, rather than an extremely compressed 'hot spot'. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2603_27927 |
| institution | arXiv |
| publishDate | 2026 |
| record_format | arxiv |
| spellingShingle | Bright Spot Characterization of Low dI/dt X-pinch Plasmas using Soft X-ray Spectroscopy with Bennett Relation Choi, YeongHwan Cha, Muhyeop Lee, Hakmin Chi, Hsiao-Chien Choi, Seongmin Bong, Seungmin Jeon, Seonghun Choi, Ookjin Ghim, Young-chul Hwang, Yong-Seok Chung, Kyoung-Jae Plasma Physics Instrumentation and Detectors This study investigates the characteristics of X-pinch plasmas driven under low current rise rate ($dI/dt$) conditions using soft x-ray spectroscopy combined with the Bennett relation. X-pinch experiments were conducted on the SNU X-pinch device using copper wires at a low $dI/dt$ of 0.2-0.3 kA/ns. The resulting 1-10 keV soft x-ray signals, measured by an x-ray filtered AXUV photodiode array (XFPA), exhibit significant nonlinear effects due to the high intensity of the soft x-ray pulses. This work characterizes the nonlinear behavior of the AXUV-HS5 Si PIN photodiodes under intense pulsed radiation using a pulsed laser. We identified a charge conservation property that the total collected charge remains proportional to the incident pulse energy despite temporal profile distortion. Based on this diagnostic finding, we developed and applied a new framework for plasma parameter estimation. By combining a spherical emission model with the Bennett equilibrium, this approach determines that the soft x-ray source plasma is a 'bright spot', characterized by a plasma density $n_e \sim 10^{21} \text{ cm}^{-3}$, size $d \sim 30-40\ μ\text{m}$, electron temperature $T_e \sim 1 \text{ keV}$, and an emission duration $t_B \sim 1 \text{ ns}$, rather than an extremely compressed 'hot spot'. |
| title | Bright Spot Characterization of Low dI/dt X-pinch Plasmas using Soft X-ray Spectroscopy with Bennett Relation |
| topic | Plasma Physics Instrumentation and Detectors |
| url | https://arxiv.org/abs/2603.27927 |