Event-Based Method for High-Speed 3D Deformation Measurement under Extreme Illumination Conditions

Fuente: arXiv

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Bibliographic Details
Main Authors:	Guan, Banglei, Bian, Yifei, Liu, Zibin, Li, Haoyang, Bai, Xuanyu, Lei, Taihang, Li, Bin, Shang, Yang, Yu, Qifeng
Format:	Preprint
Published:	2026
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2603.28159