Test-Time Scaling Makes Overtraining Compute-Optimal

Fuente: arXiv
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Bibliographic Details
Main Authors: Roberts, Nicholas, Cho, Sungjun, Gao, Zhiqi, Huang, Tzu-Heng, Wu, Albert, Orlanski, Gabriel, Trost, Avi, Buchanan, Kelly, Albarghouthi, Aws, Sala, Frederic
Format: Preprint
Published: 2026
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