A characterization of one-sided error testable graph properties in bounded degeneracy graphs

Fuente: arXiv

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Bibliographic Details
Main Authors:	Lachish, Oded, Levi, Amit, Newman, Ilan, Reidl, Felix
Format:	Preprint
Published:	2026
Subjects:	Data Structures and Algorithms
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2604.04466